VIN Patcher Test Lab

Production Algorithm Testing

Production Testing Interface
Upload BCM D-FLASH or RFHUB EEE files to test the verified VIN patching algorithms. Supports all 6 BCM variants and RFHUB with polynomial auto-detection.

1. Upload Module File

Select BCM D-FLASH (.bin) or RFHUB EEE (.bin) file

Module File

2. Configure Patch

Enter new VIN and select module type

New VIN (17 characters)

0/17 characters

Module Type